A newly unveiled testing platform from Teradyne measures every individual emitter in a microLED array to support high volume precision manufacturing. The system employs a spectrometer and high resolution camera to analyze spectral response, uniformity, and per pixel luminance across arrays containing millions of microLEDs. Integrated optical and electrical measurements are performed in a single insertion to characterize devices at the wafer, die, and finished module stages.

The Iris 100 targets the transition of microLED technology from laboratory environments to mass production for AR microdisplays and AI data center optical interconnects. Teradyne positions the technology as a short reach scale up interconnect for GPU to memory links where copper is becoming constrained. Semiconductor Test division president Shannon Poulin said these interconnects are becoming foundational to how AI data centers scale.